Patent · US Expired

Test strip measuring system

US6315951A · kind A · utility

69Cited by
6References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMay 20, 1999
Grant dateNov 13, 2001
Priority date
Expiry dateMay 20, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N35/00029
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In a test strip measuring system including a test strip with at least one test field and a measuring device for measuring optically or by means of electrical currents detectable values of the test field, a code carrier is provided for insertion into the measuring device along with the test strip. The code carrier, by way of an electronic memory, stores information used by the measuring device in measuring the test field of the test strip. The code carrier also includes a data processing device for reading the stored information from the memory and for supplying it to the measuring device. The selection of the program for reading the stored information from its memory and other factors are so controlled by controlled information supplied from the measuring device as to make it extremely difficult for copiers to make usable copies of the code carrier by merely copying the information stored in the code carrier memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.