Multiple scatter system for threat identification
US6320933A · kind A · utility
170Cited by
6References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 24, 1999 |
| Grant date | Nov 20, 2001 |
| Priority date | — |
| Expiry date | Nov 24, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and a method for determining the density of an object. The intensity of x-rays backscattered from the object is measured by at least two backscatter detectors disposed at different distances from the intersection of an incident x-ray beam with the plane of the detectors. At least one of detectors is sensitive only to x-rays that have scattered more than once in the object, the ratio of scattered x-rays measured by the detectors being a function of the density of the scattering medium.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.