Sensor characterization in memory
US6320934A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 19, 2001 |
| Grant date | Nov 20, 2001 |
| Priority date | — |
| Expiry date | Mar 19, 2021 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An X-ray image sensor comprising an array of sensor elements and a sensor characterization storage device is provided. The sensor characterization storage device stores sensor characterization information identifying defects in the array of sensor elements. The X-ray image sensor may have an intergrated interpolator, and the interpolator processes image data from the array of sensor elements by using the sensor characterization information to correct for the defects in the array of sensor elements. An X-ray imaging system comprising the X-ray image sensor and a computer also is provided. The X-ray image sensor provides to the computer a signal corresponding to image data from the array of sensor elements. The X-ray image sensor provides to the computer the sensor characterization information, and the computer processes the image data using the sensor characterization information to correct for the defects in the array of sensor elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.