Electronic measurement instrument probe accessory offset, gain, and linearity correction method
US6321171A · kind A · utility
20Cited by
21References
16Claims
0Family size
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Inventor
Key dates
| Filing date | Apr 3, 1998 |
| Grant date | Nov 20, 2001 |
| Priority date | — |
| Expiry date | Apr 3, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D18/008
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A correction method for an electronic instrument accessory probe utilizes an error correction equation wherein at least one term contains an exponent less than unity. One simple such equation is: S=Cs.sup.2 +Bs+A+b.vertline.s.vertline..sup.x (where 0<x<1), but additional terms may be added, either with integer exponents greater than 2, or with other fractional exponents less than one. In the most simple embodiment, there are only four coefficients and the only term with a fractional exponent has an exponent of 1/2 (i.e., x=0.5). A second set of coefficients may be needed for the correction of negative values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.