Patent · US Expired

Single-electron memory device using an electron-hole coulomb blockade

US6323504A · kind A · utility

10Cited by
8References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 1, 2000
Grant dateNov 27, 2001
Priority date
Expiry dateFeb 1, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/937
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

A single-electron memory device using the electron-hole Coulomb blockade is provided. A single-electron memory device in accordance with an embodiment of the present invention includes a plurality of quantum dot tunnel-junction arrays, a gate electrode, and source and drain electrodes. The plurality of quantum dot tunnel-junction arrays include at least two tunnel-junctions, are parallelly coupled to each other, and are well separated from each other to prevent single-electron tunneling between them. One of the plurality of quantum dot tunnel-junction arrays includes the gate electrode, and the voltage applied to the gate electrode can vary the number of electron-hole pairs. Each of the above-mentioned plurality of quantum dot tunnel-junction arrays includes separate source and drain electrodes where voltages are applied

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.