Patent · US Expired

Self-testable spacecraft for self-testing analog functions

US6324484A · kind A · utility

2Cited by
3References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 22, 1999
Grant dateNov 27, 2001
Priority date
Expiry dateJan 22, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/008
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A circuit for testing the functionality of an analog circuit of a satellite includes a multiplexer that is coupled to a circuit element to be tested. An analog-to-digital converter is coupled to the multiplexer. A test signal generator is coupled to a controller. The controller is also coupled to the analog-to-digital converter. The controller generates test signals that are coupled to the circuit element. Response signals are generated from the circuit elements and are received by the controller through the multiplexer and analog-to-digital converter. The controller compares the response signals to a predetermined signal indicative of a proper response. An indicator is coupled to the controller to provide an indication of whether or not the circuit elements are functioning properly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.