Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time
US6324486A · kind A · utility
6Cited by
1References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Mar 1, 1999 |
| Grant date | Nov 27, 2001 |
| Priority date | — |
| Expiry date | Mar 1, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system is presented for optimizing the number of required measurements to obtain in real-time by an automated tester that tests a device under test. During a test run, historical measurements are obtained and tracked. Each subsequent iteration the test attempts to re-measure the fewest number of measurements in real-time to obtain an accurate reflection of whether the device being tested passes or fails based on the real-time measurements and substituting historical measurements for those required measurements that were not taken in real-time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.