Patent · US Expired

Methods for analyzing eye

US6325765A · kind A · utility

32Cited by
5References
17Claims
0Family size

Inventors

Key dates

Filing dateApr 14, 2000
Grant dateDec 4, 2001
Priority date
Expiry dateApr 14, 2020

Classification

  • Technology area (CPC A)Human Necessities
  • CPC primaryA61B3/145
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

A method for analyzing a retinal reflection that may be of less than optimum quality is disclosed. In the event an image of a retinal reflex taken by a retinal photometer is of low contrast or have certain other degradations, then matched filter tests applied to portions of the image containing the eyes may be performed in order to locate the retinal reflex. For determining potential eye abnormalities, a plurality of intensity shape determination tests may be performed, these including comparisons of the eyes against a center of gravity of the shape distribution, a least-squares fit and an analysis of the moments of Hu (of the retinal reflex) converted to Zernike polynomials. A Hirshberg deviation test is performed to determine if one or the other, or both, of the eyes are deviating. Intrasymmetry and intersymmetry of the reflex are analyzed to indicate cataracts, differences of optical power and other similar problems.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.