Planar normality sensor
US6327520A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 1999 |
| Grant date | Dec 4, 2001 |
| Priority date | — |
| Expiry date | Aug 31, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sensor determines the planar inclination of a surface and includes a sensor body having a light emitting end. Three Z-axis sensors are positioned within the sensor body. Each Z-axis sensor includes a laser assembly having a light output for emitting a light beam from the light emitting end onto a surface to be scanned. An optical detector receives reflected light that had been emitted from the laser assembly onto a surface to be scanned. A processor is operatively connected to the optical detectors and calculates the planar inclination of the surface based on the light scattered back from the surface to be scanned. Each laser assembly has a sine wave modulation that is different from the sine wave modulation of a respective other laser assembly. The sine wave modulation is a function of amplitude, frequency modulation, DC offset, time and phase.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.