Statistical adjustment of A/D non-linearities to correct intensity ARI
US6329936A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 30, 1998 |
| Grant date | Dec 11, 2001 |
| Priority date | — |
| Expiry date | Oct 30, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/12
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Spurious artifacts in intensity emulation caused by measurement non-linearities within a statistically created raster display are reduced or eliminated by first characterizing the non-linearities. Armed with this information the collection of code values in an aperture can be inspected to notice which code values are occurring. M-many out of every n-many instances of a fat code can be replaced by an adjacent code, with a frequency of replacement that is selected to counteract the fatness. In principle, the replacement mechanism could be sensitive to prior events and propagate or distribute corrections across a family of abnormal codes. The idea is to statistically adjust the collection of codes to be closer to what it would be if there were no non-linearities. Different non-linearities may benefit from different strategies for replacement. Certain safeguards may be desirable to prevent making the problem worse rather than better.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.