Fourier transform surface plasmon resonance adsorption sensor instrument
US6330062A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 1999 |
| Grant date | Dec 11, 2001 |
| Priority date | — |
| Expiry date | Apr 30, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/359
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Adsorption of molecules onto a thin metallic surface such as of gold, silver or copper is measured by surface plasmon resonance (SPR) using Fourier Transform (FT) spectroscopy. Reflectance spectra from a prism/metallic film sample surface at a fixed angle of incidence is measured with FT spectroscopy. The reflectance spectrum exhibits a pronounced minimum due to the SPR effect, which can be shifted by changing the angle of incidence or metallic film thickness. The position of the reflectance minimum shifts in wavelength with the adsorption of molecules onto the gold surface due to a change in the index of refraction at the interface. The FT-SPR sensor instrument provides wavelength stability and reproducibility of the resonance wavelength to permit detection of small wavelength shifts, and also substantially increases the spectral range over which the SPR measurements can be made. A beam of broadband radiation from a Michelson interferometer is directed through an SPR sample cell and onto a detector where the output signal is processed using standard FT techniques.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.