Semiconductor integrated circuit device capable of reading out chip-specific information during testing and evaluation
US6330297A · kind A · utility
5Cited by
3References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 29, 2000 |
| Grant date | Dec 11, 2001 |
| Priority date | — |
| Expiry date | Feb 29, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/4402
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor integrated circuit device has a data holding section for storing information, a counter for counting the number of externally applied pulses, and a comparison/verification section. The comparison/verification section compares an output of the counter with an output of the data holding section, and verifies whether the outputs match or not. This configuration serves to reduce the number of wiring lines formed from pads to a comparison/verification circuit (a signature circuit), and thereby achieves a reduction in layout area and facilitates efficient layout work.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.