Method and apparatus for wireless testing of integrated circuits
US6331782A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 23, 1998 |
| Grant date | Dec 18, 2001 |
| Priority date | — |
| Expiry date | Mar 23, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/303
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for testing a microelectronic circuit includes a test bed for mounting a microelectronic circuit, and a signal source for applying a signal to a microelectronic circuit mounted on the test bed. The system additionally includes a test probe for wirelessly receiving electromagnetic response signals from the microelectronic circuit mounted on the test bed. In a preferred form, the electromagnetic response signals are radio-frequency signals. The test system additionally includes a computer connected to be test probe for analyzing the electromagnetic response signals. An integrated circuit for testing on the test system has a test circuit portion that emits electromagnetic radiation in response to a predetermined signal applied to the test circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.