Interferometer for monitoring wavelength in an optical beam
US6331892A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 15, 1999 |
| Grant date | Dec 18, 2001 |
| Priority date | — |
| Expiry date | Oct 15, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J9/0246
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interferometer and related methods for wavelength monitoring are disclosed. The interferometer may be used for the wavelength monitoring or as part of a wavelength feedback and control circuit for an optical signal source. The device operates by creating an output beam on which constructive and destructive optical interference may be detected. The optical interference is generated by a monochromatic beam split into a first beam traversing a stationary path and a second beam traversing a path of variable length. The first and second beams are then recombined to create constructive/destructive interference which may be measured by a detector and correlated with a processor to determine the output wavelength of the optical source. The maximum and minimum of the variable path length are precisely controlled due to use of a micro-positionable semiconductor retroreflector or mirror. Using the known oscillations of the retroreflector measured along the path of the second beam, the wavelength of optical signal source can be precisely and repetitively determined during each oscillation of the retroreflector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.