Patent · US Expired

Method for acquiring measurements and scanner with sensor groups

US6335958B1 · kind B1 · utility

3Cited by
6References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 2000
Grant dateJan 1, 2002
Priority date
Expiry dateOct 3, 2020

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S378/901
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

To solve a control complexity problem encountered with very numerous detectors of a tomodensitometer, there is provision to group the detectors into groups and to subject all the detectors of a group to the same processing. By way of improvement, the determination of the mode of processing is performed during a view, and the processing is applied to the signals detected during a subsequent view.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.