Method and system for analyzing fault and snapshot operational parameter data for diagnostics of machine malfunctions
US6336065B1 · kind B1 · utility
165Cited by
38References
44Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 12, 1999 |
| Grant date | Jan 1, 2002 |
| Priority date | — |
| Expiry date | Nov 12, 2019 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02T30/00
- WIPO fieldTransport
- WIPO sectorMechanical engineering
Abstract
A method for analyzing fault log data and snapshot operational parameter data from a machine undergoing diagnostics is provided. A receiving step allows for receiving fault log data comprising a plurality of faults from the machine. Respective executing steps allow for executing a set of noise-reduction filters upon the received fault log data to generate noise-reduced fault log data, and for executing a set of candidate snapshot anomalies upon the noise-reduced data to generate data predictive of malfunctions of the machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.