Patent · US Expired

Thermal control for a test and measurement instrument

US6336592B1 · kind B1 · utility

27Cited by
12References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 9, 1999
Grant dateJan 8, 2002
Priority date
Expiry dateDec 9, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S236/09
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A cooling system for a test and measurement instrument including a variable-speed fan, useful with different instruments having different configurations, employs a plurality of sensors disposed at predetermined locations within an enclosure of the instrument, and is software programmable with predetermined parameters of each particular configuration of each particular instrument. At least one of the sensors measures the temperature of a component that dissipates power at a substantially constant rate, and at least one of the sensors does not include a heat source to provide heat for measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.