Test piece analyzing apparatus having an excessive portion removal
US6337490B1 · kind B1 · utility
4Cited by
6References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 2, 1999 |
| Grant date | Jan 8, 2002 |
| Priority date | — |
| Expiry date | Aug 2, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00128
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test piece analyzing apparatus is provided which includes a releasably fixed absorbent member, a horizontally reciprocative pinching mechanism for simultaneously transferring a plurality of test pieces in a transfer direction, and an optical analyzing assembly provided with a primary illuminator and a secondary illuminator. The second illuminator serves to illuminate the bottom surface of the test piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.