Approximated invariant method for pattern detection
US6337927B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 1999 |
| Grant date | Jan 8, 2002 |
| Priority date | — |
| Expiry date | Jun 4, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F18/2433
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and a method for classifying input vectors into one of two classes, a target class and a non-target class, utilize iterative rejection stages to first label the input vectors that belong in the non-target class in order to identify the remaining non-labeled input vectors as belonging in the target class. The system and method may be used in a number applications, such as face detection, where the members of the two classes can be represented in a vector form. The operation of the system can be divided into an off-line (training) procedure and an on-line (actual classification) procedure. During the off-line procedure, projection vectors and their corresponding threshold values that will be used during the on-line procedure are computed using a training set of sample non-targets and sample targets. Each projection vector facilitates identification of a large portion of the sample non-targets as belonging in the non-target class for a given set of sample targets and sample non-targets. During the on-line procedure, an input vector is successively projected onto each computed projection vector and compared with a pair of corresponding threshold values to determine whether the…
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