Patent · US Expired

Method and system for analyzing fault log data for diagnostics

US6343236B1 · kind B1 · utility

160Cited by
20References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 2, 1999
Grant dateJan 29, 2002
Priority date
Expiry dateApr 2, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2268
  • WIPO fieldTransport
  • WIPO sectorMechanical engineering

Abstract

The present invention discloses a system and method for analyzing fault log data from a malfunctioning machine. The system comprises a processor for receiving new fault log data comprising a plurality of faults from the malfunctioning machine and selecting a plurality of distinct faults from the new fault log data. The processor generates at least one distinct fault cluster from the selected plurality of distinct faults. Thereafter, the processor predicts at least one repair for at least one distinct fault cluster using a plurality of predetermined weighted repair and distinct fault cluster combinations.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.