Patent · US Expired

System and method for determining the process viscosity of a fluid in a film metering device

US6343501B1 · kind B1 · utility

0Cited by
28References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2000
Grant dateFeb 5, 2002
Priority date
Expiry dateMar 8, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N33/32
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The system and the method are used to determine the process viscosity (&mgr;) of a fluid (22) in a film metering device (10) used to form a film (24) to be applied on a substrate (20), such as a paper web or any other suitable flexible materials. The apparent shear rate ({dot over (&ggr;)}) of the fluid, indicative of the flow field, may also be calculated. These parameters are calculated using a pressure profile representing the pressure of the fluid between a transfer roll (12) and a metering rod (30) which controls the thickness of the coating film (24). The torque (T) applied on the metering rod (30) is also measured and taken into account in the calculations. The system and method allow the process viscosity (&mgr;) to be easily and accurately determined during the operation of the film metering device (10) without the need of testing the fluid in an external device and attempting to extrapolate the results to the process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.