Patent · US Expired

Method of checking authenticity of a data carrier

US6343743B1 · kind B1 · utility

81Cited by
20References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 17, 1998
Grant dateFeb 5, 2002
Priority date
Expiry dateJun 17, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG07F7/086
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

The invention relates to a method for testing the authenticity of a data carrier with an integrated circuit and is characterized in that a material is provided in an area of the integrated circuit which is excited to luminesce for example by an electromagnetic radiation or by an electric field, the electromagnetic radiation emitted by the material being measured and evaluated for determining the authenticity of the data carrier.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.