System and method for on-chip calibration of illumination sources for an integrated circuit display
US6344641B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 11, 1999 |
| Grant date | Feb 5, 2002 |
| Priority date | — |
| Expiry date | Aug 11, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG09G2360/144
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An on-chip system and method for calibrating an illumination source includes a photo-detector and intensity sense and control circuitry resident on an integrated circuit. The integrated circuit is illuminated by an illumination source, which impinges upon the photo-detector. The intensity sense and control circuitry receives the measured intensity value of the illumination source and compares the measured intensity to a predetermined value representing the desired intensity. Subject to a range of operation, the intensity sense and control circuitry adjusts the intensity of the illumination source based upon the difference between the measured illumination intensity and the desired illumination intensity.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.