Method and device for calibrating a probe system

US6347277B2 · kind B2 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Markus Amtmann · Regensburg, DE
• Stephan Bolz · Pfatter, DE
• Jürgen Rössler · Erlangen, DE

Key dates

• Filing date: Feb 12, 2001
• Grant date: Feb 12, 2002
• Expiry date: Feb 12, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/4175
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A control circuit of an exhaust probe has a microcontroller and an analog circuitry. Measured values which are recorded in a test chamber under predefined test conditions are stored in characteristic maps in a programmable read-only memory. These values are then used as a reference for a subsequent recalibration of a probe system.