Patent · US Expired

Tandem time-of-flight mass spectrometer with delayed extraction and method for use

US6348688B1 · kind B1 · utility

93Cited by
20References
37Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 19, 1999
Grant dateFeb 19, 2002
Priority date
Expiry dateJan 19, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/40
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A tandem time-of-flight mass spectrometry including a pulsed ion generator, a timed ion selector in communication with the pulsed ion generator, an ion fragmentor in communication with the ion selector, and an analyzer in communication with the fragmentation chamber. The fragmentation chamber not only produces fragment ions, but also serves as a delayed extraction ion source for the analyzing of the fragment ions by time-of-flight mass spectrometry.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.