Semiconductor etalon device, optical control system and method
US6349156B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 28, 1999 |
| Grant date | Feb 19, 2002 |
| Priority date | — |
| Expiry date | Oct 28, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B2006/12123
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A semiconductor device is provided with at least two photodetectors and an interposed etalon. Signals from the photodetectors may be compared to generate a control signal. The control signal may be used for wavelength control and/or stabilization and for other purposes. According to a preferred embodiment, the etalon is formed of at least two distributed Bragg reflectors. The etalon provides high discrimination power. In addition, the etalon has a periodic discrimination function that may be matched to the periodic channels of a dense wavelength division multiplexing system. According to one aspect of the invention, electrical current may be applied to selected layers of the device to tune and/or shift the response of the device. If desired, the invention may be incorporated into a waveguide structure, such as an optical fiber. The present invention also relates to a wafer fusion technique for making integrated devices.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.