Patent · US Expired

Multilayered wiring structure and method of manufacturing the same

US6351026B2 · kind B2 · utility

5Cited by
2References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 27, 2001
Grant dateFeb 26, 2002
Priority date
Expiry dateJun 27, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K2203/0733
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A multilayered wiring structure includes a lower wiring layer, an interlevel insulating layer, a filling layer, an upper wiring layer, and a plated layer. The lower wiring layer is formed on a lead frame through an insulating layer. The interlevel insulating layer is formed on the lower wiring layer to have a via hole at a predetermined region thereof to expose an upper portion of the lower wiring layer. The filling layer is made of a conductive material to fill the via hole. The upper wiring layer is formed on the interlevel insulating layer to have an opening above a portion where the via hole is formed. The plated layer is formed on the upper wiring layer to be connected to the filling layer. A method of manufacturing a multilayered wiring structure is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.