Calibrating combinations of probes and channels in an oscilloscope
US6351112B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 31, 1998 |
| Grant date | Feb 26, 2002 |
| Priority date | — |
| Expiry date | Aug 31, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06788
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrical probe is provided for use with an electrical instrument, such as an oscilloscope. The probe includes a probe body, a sensing element affixed to the probe body for sensing an electrical parameter and a storage device containing probe information that uniquely identifies the probe. The probe information is electronically transferred from the storage device to the electrical instrument when the probe is connected to the electrical instrument. The electrical instrument stores calibration information that is associated with the probe. The electrical instrument uses the probe information received from the storage device in the probe to access the associated calibration information. The accessed calibration information is used to calibrate measurements made with the probe.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.