Patent · US Expired

Method for quality function deployment

US6351680B1 · kind B1 · utility

10Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 14, 1999
Grant dateFeb 26, 2002
Priority date
Expiry dateMay 14, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06Q10/04
  • WIPO fieldIT methods for management
  • WIPO sectorElectrical engineering

Abstract

An exemplary embodiment of the invention is directed to a method for performing quality function deployment for a system having a plurality of levels. The method includes obtaining a plurality of first level critical to quality parameters and obtaining a plurality of first level key control parameters. A first level quality matrix is generated identifying an effect at least one first level key control parameter has on at least one first level critical to quality parameter. The first level key control parameters are arranged into a first group and a second group. A second level quality matrix is generated for the first group. The second level quality matrix includes second level critical to quality parameters corresponding to the first group of first level key control parameters and a second level key control parameter. The second level quality matrix identifies an effect said second level key control parameter has on at least one second level critical to quality parameter.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.