Voltage and clock margin testing of memory-modules using an adapter board mounted to a PC motherboard
US6351827B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 30, 2000 |
| Grant date | Feb 26, 2002 |
| Priority date | — |
| Expiry date | Oct 30, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K1/141
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Margin testing of memory modules uses a personal computer (PC) motherboard. A test adaptor board has a test socket that receives a memory module under test. Pins from the test adaptor board are plugged into holes of a removed memory-module socket on the motherboard, mounted on the reverse, solder side of the motherboard. The test adapter board has a voltage regulator that controls the power-supply (Vcc) voltage applied to the module under test. A delay circuit on the test adapter board varies the phase delay of a clock to the memory module under test. Margin control signals are generated by a controller card in the PC's expansion slots, to control Vcc and clock delay to the module under test without changing the motherboard's Vcc voltage. The test program executing on the PC motherboard writes to the controller card to adjust voltage and delay, allowing Vcc and setup and hold margins to be tested.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.