Patent · US Expired

Method of using a wide wavelength range high efficiency avalanche light detector with negative feedback

US6353238B2 · kind B2 · utility

2Cited by
24References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 23, 2001
Grant dateMar 5, 2002
Priority date
Expiry dateApr 23, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F30/225

Abstract

A novel use of a solid state light detector with a low impedance substrate is described. Light that enters the substrate after traversing the antireflective layer creates an electron-hole pair. The electrons are collected in a crystalline epitaxial layer that spans the space charge region, or depletion layer. A high electric field accelerates free electrons inside the depletion region. The electrons collide with the lattice to free more holes and electrons resulting from the presence of a n-p junction, or diode. The diode is formed by placing the crystalline layer which has positive doping in close proximity with the electrodes which have negative doping. The continual generation of charge carriers results in avalanche multiplication with a large multiplication coefficient. During the avalanche process, electrons can be collected enabling light detection. A resistive layer is used to quench, or stop, the avalanche process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.