Patent · US Expired

Wide temperature range RTD

US6354736B1 · kind B1 · utility

25Cited by
18References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 24, 1999
Grant dateMar 12, 2002
Priority date
Expiry dateMar 24, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01C7/22
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

An RTD having a thin film HfN resistor formed on a substrate for temperature detection in accordance with the resistance of the HfN resistor. The RTD is a two lead device having high accuracy and a wide temperature range from 20 to 1400 degrees Kelvin. The substrate has bonding pads or contact strips connected to the resistor and processing electronics. An SiN thin film passivation layer is formed on the resistor and substrate. Two leads connect the bonding pads or contact strips to processing electronics and an indicator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.