Patent · US Expired

Microelectronic integrated sensor

US6355964B1 · kind B1 · utility

4Cited by
16References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 28, 2000
Grant dateMar 12, 2002
Priority date
Expiry dateJul 28, 2020

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81B2203/053
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A microelectronic integrated sensor is formed with a cantilever. For the purpose of ensuring a system which is especially invulnerable to mechanical strains during production, the cantilever is placed freely movably on a support, and motion limiters are provided on the edge. The invention also provides for the formation of nitride pillars for supporting the upper layers, in order to further increase the stability. A corresponding production process for producing the sensor is disclosed as well.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.