Method and apparatus for the in-circuit testing of a capacitor
US6356086B1 · kind B1 · utility
15Cited by
2References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 12, 1999 |
| Grant date | Mar 12, 2002 |
| Priority date | — |
| Expiry date | Apr 12, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/27
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test apparatus and method of testing a capacitor while it is still in-circuit incorporation a sequence of tests including a DC capacitance value measurement, a measurement of the DC current paths in parallel with the capacitor, a measurement of the equivalent series resistance of the capacitor, and an AC impedance measurement of the capacitor and its associated circuitry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.