Patent · US Expired

Method of manufacturing semiconductor device

US6358767B2 · kind B2 · utility

16Cited by
2References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 6, 2001
Grant dateMar 19, 2002
Priority date
Expiry dateJun 6, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K3/361
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

In the steps of manufacturing a liquid crystal display, a step of reducing the electrostatic destruction of switching elements is provided. An electrostatic destruction preventing short-circuiting ring is left on an active matrix substrate until the execution of a short-circuiting bar-carrying FPC fixing step is finished. This enables the electrostatic destruction of the switching elements, which occurs due to the operations in a chamfering step to a FPC fixing step, to be reduced.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.