Relating to monitoring ion sources
US6365901B1 · kind B1 · utility
2Cited by
21References
19Claims
0Family size
Assignees
Inventors
Key dates
| Filing date | May 7, 1999 |
| Grant date | Apr 2, 2002 |
| Priority date | — |
| Expiry date | May 7, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/185
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
The apparatus and method provide techniques for monitoring the position on alpha contamination in or on items or locations. The technique is particularly applicable to pipes, conduits and other locations to which access is difficult. The technique uses indirect monitoring of alpha emissions by detecting ions generated by the alpha emissions. The medium containing the ions is moved in a controlled manner frog in proximity with the item or location to the detecting unit and the signals achieved over time are used to generate alpha source position information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.