Method and apparatus for high throughput media defect testing using true reference value
US6366081B1 · kind B1 · utility
12Cited by
1References
38Claims
0Family size
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Key dates
| Filing date | Feb 25, 2000 |
| Grant date | Apr 2, 2002 |
| Priority date | — |
| Expiry date | Feb 25, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/1207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus are provided for efficiently testing magnetic media in which a read level test is performed using an approximation for an average signal level in determining a test threshold and while reading data and testing against the approximate average read signal level, the data signal level is averaged to determine the real average read signal and this value is then used to adjust the results of the comparisons performed against the approximate average read level.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.