Patent · US Expired

Probe device for measuring a magnetic field vector

US6366085B1 · kind B1 · utility

14Cited by
3References
41Claims
0Family size

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Key dates

Filing dateSep 11, 1997
Grant dateApr 2, 2002
Priority date
Expiry dateSep 11, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/0206
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and a measuring device for determining the spatial distribution of a magnetic field vector. At least a pair of sensor elements is provided. Each sensor element measures a component of the magnetic field vector. The sensor elements are aligned in a parallel, spaced-apart relationship along an axis parallel to the measured components.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.