Method and device for detecting and locating irregularities in a dielectric
US6366095B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 7, 1999 |
| Grant date | Apr 2, 2002 |
| Priority date | — |
| Expiry date | Dec 7, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/1272
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for detecting at least one irregularity in the dielectric around a substantially elongate conductor, comprising of: applying a potential difference between the conductor and the earth; measuring at a first position voltage changes caused by said irregularity and moving in the direction of the first position; measuring at a second position voltage changes caused by said irregularity and moving in the direction of the second position; determining with the use of time registration the difference in arrival time of voltage changes caused by the same irregularity and measured at the first and second position; determining the position of the irregularity in said conductor on the basis of the, difference in arrival time and the length of said conductor between the first and second position.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.