Patent · US Expired

Method of operating flash memory

US6366499B1 · kind B1 · utility

17Cited by
4References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 10, 2000
Grant dateApr 2, 2002
Priority date
Expiry dateOct 10, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B69/00

Abstract

A method of programming an electrically programmable memory cell which cell includes a transistor formed in a semiconductor substrate of first conductivity type having a surface a first well region of second conductivity type is disposed in the substrate adjacent the surface thereof. A second well region of first conductivity type is disposed in the first well region adjacent the surface. The transistor has a source region, a drain region, a floating gate, and a control gate. The method includes raising the control gate to a first selected potential no greater than 9.0 volts, raising the drain to a potential to no more than 5.0 volts, coupling the source region to ground potential, coupling the first well region of second conductivity type to ground potential, and placing the second well region at a potential below ground potential.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.