Defect parameter for wooden members
US6367330B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 17, 2000 |
| Grant date | Apr 9, 2002 |
| Priority date | — |
| Expiry date | Aug 17, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/102
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention describes a method and system for detecting anomalies in a material. The method comprises the steps of transmitting waves through the object, receiving the waves after passage through the object, determining more than one reference characteristic, measuring more than one characteristic of the received wave, comparing a first reference characteristic with a first characteristic of the received wave to create a first factor, comparing a second reference characteristic with a second characteristic of the received wave to create a second factor, combining the first factor with the second factor to create a defect index, and identifying a location of one or more anomalies in the object using the defect index. The step of determining the reference characteristics may comprise transmitting another wave of known characteristics through a material free of anomalies to produce a standard wave, and measuring one or more characteristics of the standard wave. Alternatively, the step of determining the reference characteristics may comprise calculating the reference characteristics from known values of the transmitted wave. The method may further comprise the steps of moving the ob…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.