Patent · US Expired

Method for determining the thickness of a layer of electrically conductive material

US6369565B1 · kind B1 · utility

6Cited by

3References

2Claims

0Family size

Assignee

Robert Bosch GmbH · DE

Inventors

Klaus Dobler · Gerlingen, DE
Hansjoerg Hachtel · Rutesheim, DE
Reinhard Dimke · Stuttgart, DE
Franz Auf Der Heide · Litzendorf, DE
Richard Blattert · Murr, DE
Josef Weber · Oberriexingen, DE

Key dates

Filing date	Apr 28, 2000
Grant date	Apr 9, 2002
Priority date	—
Expiry date	Apr 28, 2020

Classification

Technology area (CPC G)Physics
CPC primaryG01B7/105
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In a method for determining a thickness of a layer of electromagnetically conductive material, the measurement errors resulting from different quality of the basic material are eliminated. For each basic material, one dimensionless characteristic value (K) is ascertained. With the aid of a characteristic calibration curve, each characteristic value (K) can be assigned a correction factor (F), with which the measured value of the layer thickness (DM) can be converted into a real value of the layer thickness (D). Different electrical and magnetic properties, dictated by the different quality of the basic material, can thus be largely eliminated.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.