Patent · US Expired

Apparatus and method using photoelectric effect for testing electrical traces

US6369590B1 · kind B1 · utility

8Cited by

4References

17Claims

0Family size

Assignee

ManiaTech Incorporated · US

Inventors

Mario A. Cugini · Vista, US
Jeff Brakley · San Diego, US
Gilbert Norman Ravich · Lawndale, US

Key dates

Filing date	Jan 14, 1999
Grant date	Apr 9, 2002
Priority date	—
Expiry date	Jan 14, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/309
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A tester (10), for testing electrical trace (90T) without electrical connection to test trace (90T), generally comprises an electro-magnetic source (25), such as a laser (26) for providing a beam (39) of electro-magnetic radiation, such as of ultraviolet light, directed on a single test trace (90T) for producing a photoelectric effect on test trace (90T) liberating electrons therefrom, a collector (50) disposed near test trace (90T) for collecting liberated electrons, and a collector circuit (60) electrically connected to collector (50) for supplying a positive potential thereto and including a meter (70) for measuring the photoelectric current to collector (50) from trace (90T).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.