Patent · US Expired

Methods and systems for determining x-ray beam position in multi-slice computed tomography scanners

US6370218B1 · kind B1 · utility

26Cited by
3References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 21, 1995
Grant dateApr 9, 2002
Priority date
Expiry dateOct 19, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2223/419
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Focal spot position determination systems having a high sensitivity to focal spot movement for use in connection with multi-slice computed tomography imaging systems are described. In one embodiment, the determination system is configured for application in a two slice system. Signals from adjacent detector cells in separate rows are compared to determine focal spot position. More particularly, the signal intensity A of the signal output by a first detector cell and the signal intensity B of the signal output by the second detector cell are related to the position of the focal spot. That is, the z position of the centerline of the fan beam can be determined by relating the signal intensities A and B according to the ratio [(A−B)/(A+B)]. Such ratio is representative of the beam location and can be used to control adjustment of the imaging system pre-patient collimator to maintain the beam in the desired position.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.