On-demand process sorting method and apparatus
US6370676B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | May 27, 1999 |
| Grant date | Apr 9, 2002 |
| Priority date | — |
| Expiry date | May 27, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/319
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process sort test circuit and methodology for determining performance characteristic of an IC chip. The circuit is located on an IC chip itself and comprises an input for receiving an input signal; a first path from the input to a first output for transmitting the input signal to the first output, the first path sensitive to variations in a manufacturing process for the IC chip; a second path from the input to a second output for transmitting the input signal to the second output, the second path being substantially less sensitive to the variations in the manufacturing process for the IC chip; and, a pulse generator device coupled to the first and second outputs for detecting a difference in arrival times of the input signal at the first and second outputs and for outputting a sort signal if the difference is of a preselected magnitude. The sort signal enables output indication of a performance characteristic of the IC chip.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.