Patent · US Expired

Thyristor with breakdown region

US6373079B1 · kind B1 · utility

6Cited by
4References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 30, 1999
Grant dateApr 16, 2002
Priority date
Expiry dateMar 30, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D62/53
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The thyristor is based on a semiconductor body with an anode-side base zone of the first conductivity type and one or more cathode-side base zones of the opposite, second conductivity type. Anode-side and cathode-side emitter zones are provided, and at least one region in the cathode-side base zone whose geometry gives it a reduced breakdown voltage as compared with the remaining regions in the cathode-side base zone and the edge of the semiconductor body. At the anode, below the region of reduced breakdown voltage, the thyristor has at least one recombination zone in which the free charge carriers have a reduced lifetime.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.