Patent · US Expired

Automated test generator

US6378088B1 · kind B1 · utility

42Cited by
16References
60Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 14, 1998
Grant dateApr 23, 2002
Priority date
Expiry dateJul 14, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/3684
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A test generator generates tests by randomly traversing a description of the interface of a program being tested, thereby generating tests that contain randomly selected actions and randomly generated data. When executed, these tests randomly manipulate the program being tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.