Device and process for the examination of cells using the patch-clamp method

US6379916B1 · kind B1 · utility

Assignee

• Fraunhofer-Gesellschaft zur förderung der angewandten Forschung e.V. · DE

Inventor

• Joerg Meyer · Wagenfeld, DE

Key dates

• Filing date: May 30, 2000
• Grant date: Apr 30, 2002
• Expiry date: May 30, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N33/48728
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Disclosed is a device and a process for examining cells using the patch-clamp method. A plane arrangement is used of a first number of micro-cuvettes for receiving cells and a plane arrangement of a second number of micro-pipettes which can be positioned in relation to the plane arrangement of micro-cuvettes in such a manner that a multiplicity of cells located in the micro-curvettes can be examined simultaneously.