Patent · US Expired

Dynamic random access memory

US6381186B1 · kind B1 · utility

4Cited by
21References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 28, 2001
Grant dateApr 30, 2002
Priority date
Expiry dateAug 28, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/401
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A dynamic random access memory includes a plurality of dynamic memory cells arranged in rows and columns, a word line connected to the memory cells on the same row, a bit line connected to the memory cells on the same column, a word line selecting circuit having a word line selecting function of selecting an arbitrary one of the rows in response to an internal address signal, a word line driving voltage source, a word line driving circuit having at least one driving MOS transistor connected between the word line driving voltage source and the word line, for driving the word line in response to an output signal of the word line selecting circuit, and a control circuit for, in response to a voltage stress test control signal input from outside, controlling the word line driving circuit so that the word line driving circuit drives word lines more than those selected in a normal operation mode upon receiving an external address signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.