Patent · US Expired

Method and apparatus for detecting low light levels

US6384401B1 · kind B1 · utility

5Cited by
6References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateOct 10, 2000
Grant dateMay 7, 2002
Priority date
Expiry dateOct 10, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01J1/44
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for measuring very low light signals including integrating a signal from a photo diode, avalanche photo diode, photomultiplier tube or the like, digitally sampling the integrator output more than two times during each integration period, fitting a curve to the multiple digitized readings to calculate the integration slope for each integration period and determining the original signal from the calculated integration slope.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.